By Katty Van Mele
Business Development Manager
Sarnoff Europe
The hunger for
shorter design cycles and rapid product innovation needs to be fed by
a.o. silicon and product proven re-usable IP. To address such
important business need, Sarnoff Europe introduced so-called TakeCharge®
Design Kits, offering proven solutions with design and integration tools
for on-chip ESD protection, which is another non-core but necessary
technology for nano-CMOS ICs. The response from foundry and fabless
companies worldwide reflects the importance of integrated ESD design
in the overall IC design process.
Trends and
Challenges for ESD design in 65nm
Until recently,
IDM companies were leading the new technology and application introductions,
preceding the industry by an entire process generation. However
the fabless/foundry industry caught up with the IDM market in terms
of product innovation, new supporting platform alliances, and also enticed
them to fab-lite business models.
Moreover, the
fast increasing complexity of innovative IC design prompts the use of
advanced 3rd party IP. Fast ramp-up of new IC, together
with a vast array of additional functionalities that are implemented
with each new product release, necessitate the integration of IP which
can be used on multiple processes and foundries.
The increased
competition in the fabless design sphere has made differentiation and
innovation in the IC design the ultimate key to success. Standard
application CMOS ESD design down to 180nm was generally covered by foundry
process rules, with little need for additional expertise. The
introduction of advanced nano-CMOS IC design has changed the scope of
ESD design into an integral part of innovative IC design.
Advanced ESD
design has become an enabler of IC design
differentiation and innovation. All too often, the ESD design
concepts implemented successfully in mature process generations compromise
IC functionality when applied in 65nm IC design. At the same token,
too many innovative IC's fail to make a timely entrance in the market
due to ESD failures. "Today, more than 25% of the fabrication
failures and 38% of the field returns are attributed to EOS/ESD" said
M. Mergens at an ESD web seminar in October 2007. "It is the predominant
failure mechanism for ICs."
Companies are
increasingly faced with the difficult choice between meeting ESD specs
or meeting the product release deadline. And yet, even in nano-CMOS,
ESD design should never become such a critical issue.
The requirements
for adequate ESD protection have kept pace with the increased IC design
complexity, and the solutions must fit advanced custom design applications.
However, economic pressures, the cost of nano-CMOS IC design and the
need for fast ramp-up of production, now also require the design teams
to prepare their IC design for production on different fabs and/or foundries.
In order to successfully design ESD protection strategies in this changing
process environment, the IC designers now need to implement process
independent ESD solutions, often prompting the need for a total review
of in-house ESD experience and expertise.
To top off the
challenges, since in-house ESD teams become fully involved in the IC
design flow in order to integrate adequate ESD protection strategies,
this reduces their window to develop such advanced ESD solutions, while
their need for specialist expertise increases. Many companies
have replied to this challenge by adding 3rd party ESD IP
to the in-house knowledge. In-house design teams can tailor this additional
and highly specialized IP to their specific individual IC design needs
while preserving the unique nature of their individual design.
Nevertheless, they can rely on product proven ESD solutions and strategies
and ensure multi-fab manufacturability of the design, without considerably
increasing the cost of ownership.
TakeCharge®
advanced ESD solutions : empower the
IC designer - enable the IC design
Sarnoff Europe
has built up an extensive solutions portfolio focusing on such advanced
and specialty applications as high speed, SerDes, RF, analog and mixed
signal design. These applications require highly specialized and/or
scalable ESD protection concepts to adequately protect custom innovations.
ESD solutions are product proven down to 65nm on multiple foundry and
proprietary processes, while silicon analysis is currently being carried
out on 45nm solutions.
As IC design moves
into advanced nano-CMOS space, Sarnoff Europe has continued to focus
on the smallest possible protection concepts, ensuring lowest capacity
and resistivity for applications in high speed / SerDes interfaces (e.g.
HDMI, DVI,...), communication and networking environment, logic LSIs
(FPGA, Asic, ...), LCD driver IC, power management ICs or applications
on SOI technology. Based on its experience in these different
types of applications, Sarnoff Europe has built up a reputation for
its specialty ESD solutions, backed up by more than 335 advanced volume
products to date in which TakeCharge® ESD solutions are implemented.
Moreover, the
company focuses heavily on the individual design needs of innovative
design companies. Sarnoff not only licenses a set of process/foundry
optimized solutions, but also delivers a full package of ESD design
strategies and methodologies, integration and calculation tool in the
TakeCharge® Design Kit, available for all major foundry processes
and generations in standard nano-CMOS, or custom made for proprietary
and/or specialty processes such as HV-CMOS, SOI....
As an IP provider,
Sarnoff Europe focuses heavily on design enablement. TakeCharge®
customers are empowered to independently implement the solutions and
protection strategies into their IC design, without the need for constant
consultation throughout the design cycle. To empower the ESD/IC
design teams, the TDK includes mandatory a 2-day training, with full
Q&A period and first product ESD review by Sarnoff engineers prior
to tape-out. In 2007, 130 new products were successfully released
by customers, underlining yet again the versatility of Sarnoff's ESD
solutions.
Case study
: TakeCharge ESD solutions for communication and networking applications
Background
Recent applications
require higher signal data throughput than ever before. PC (Serial ATA,
PCI-express) and multimedia (DVI, HDMI) interfaces are running at speeds
between 1Gbps and 10Gbps. At these data rates, the IO designer must
carefully define the matching circuit connected at the bond pad. Impedance
variations can cause reflections and ringing. Signal attenuation and
degradation can cause the characteristic 'eye' measurement to close
at the high frequencies. Many of these high speed interfaces rely on
serial communication using differential LVDS or TMDS circuit concepts
to channel the multimedia content between set top box, DVD player and
TV receiver sets.
ESD complexity
To create
economically viable circuit solutions, IC designers rely on standard
digital (foundry) CMOS for the multimedia applications. However, the
advanced CMOS process nodes (130nm - 90nm) include sensitive elements
that are easily damaged during ESD stress. Certainly for the HDMI, DVI
interfaces where the end user interaction can cause severe system level
stress, robust and effective ESD protection must be in place. While
many system makers relied on board-level ESD protection in the past,
today most are working to include the ESD protection on-chip, requiring
8kV HBM (Human Body Model) protection.
Adding ESD
protection onto the silicon die, adds parasitic capacitance to the IO
pad which can possibly degrade the signal at higher frequencies. IO
designers need low and stable (over signal voltage and frequency) capacitance
and low resistance. Also the leakage of the ESD protection cell must
be limited because many of the Consumer Electronics appliances are powered
from a battery.
Experience from Sarnoff
Sarnoff has
been working together with a number of customers (Fabless and IDM) in
the field of high speed IC applications. Currently product proven solutions
for the following IC applications are available on the market
Application
CMOS
node
SerDes IO's
in FPGA
180nm - 65nm
10 Gbps Optical
communications
180nm - 130nm
HDMI
130nm
USB 2.0
130nm - 90nm
Serial ATA
130nm - 90nm
Key technical benefits for
working with Sarnoff
IC designers
have worked with Sarnoff to enable high speed throughput without
compromising interface ESD performance.
For high speed
interfaces, Sarnoff has focused on multiple items:
Area efficient ESD
solutions to reduce the total ESD area as much as possible.
Low capacitive, low
resistive
High ESD protection
with low cap: 100fF-200fF for 4kV
Low-to-zero resistance
in the pad
Scalable ESD performance
to allow any ESD requirement on-chip.
Low leakage and Latch-up
immune devices
Over voltage tolerant
options available
Example circuit
protection
An example
of a protection concept for a SerDes application in 90nm is depicted
below. The end user required 200V Machine Model (MM) on-chip ESD protection.
Low leakage during normal operation: 1nA @ 1.2V
Low capacitive full local protection of sensitive analog IO: Total junction capacitance <190fF
Small area for local protection: 1200 um2
Low noise, high speed enabled: No series resistance inserted between pad and input/analog IO
Customer testimonials
Bradley Howe, vice
president of IC Design at Altera,
"We chose TakeCharge®
technology for our FPGA product families as part of Altera's commitment
to deliver high-performance, cost-effective programmable products to
our customers. TakeCharge® has allowed us to effectively manage both
ESD protection and IO area."
Shoji Ichino, general
manager, Technology Development Division, Electronic Devices Business
Unit of Fujitsu Limited
"Fujitsu selected
Sarnoff's TakeCharge® to help continue our tradition of providing
customers with highly reliable high-performance products and services
based on powerful technologies. TakeCharge® will be Fujitsu's primary
ESD solution for their 65nm CMOS technologies after its full deployment
in Fujitsu's related standard IO libraries."
Sarnoff Europe
headquartered in Gistel, Belgium, is
a subsidiary company of Sarnoff Corporation, formerly known as RCA Laboratories.
Sarnoff Europe assumes worldwide responsibility for the development
and commercialization of Sarnoff's TakeCharge on-chip ESD protection
IP.
Katty Van Mele joined Sarnoff Europe in 2006 as Business Development Manager, bringing more than 15 years experience in worldwide B-2-B marketing and business development in several technology sectors with her. In this position, she has been responsible for expanding the fabless partner base both in the North-American and Asian markets. Moreover, she actively fostered new alliances with top-tier foundries such as UMC, Tower Semiconductor, ...
Prior to joining Sarnoff Europe, Katty held positions in business development and strategic alliances with Citilog and Traficon in Europe, and with the Dynamic Holding Group in Hong Kong/China. She received a post-university degree in International Economics/Relations and East-Asian Economy from SAIS, The Johns Hopkins University.