Built-in Self-Test (BIST) techniques enable IP components to test their own functional operations to reduce the manufacturing test costs in a shorter amount of time.
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Boundary scan is a method that is used to debug the functional operation of a device by watching pin states and voltage levels.
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Joint Test Action Group (JTAG) is an architecture to monitor the functional correctness of a device through a set of debug pins.
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Other IP includes many additional types of Test IP
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IP components with self-repair capabilities typically include algorithms to detect functional issues and repair them.
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