Sidense OTP Macros for Security Applications
Information kept in logic circuitry, ROM, laser fuses and electrical fuses can be read directly using optical, SEM or FESEM (Field Emission Scanning Electron Microscope) microscopes, after preparation of the sample. Laser fuses and electrical fuses are the easiest to read back. Some ROM technologies are more difficult to optically reverse engineer than others. The most challenging are those programmed with subtle Vt ion implantation. Typical additional protection measures include scrambling of stored information.
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